Comments to Integration testing:
ADF-TAB/GAB integration test
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hardware
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o 1 ADF crate (1 VI slave, ADF card(s) )
o 1 TAB crate (TAB card(s) )
o 1 communication crate (bit3 card, VME/SCL card, SCLD, 1 master VI)
o 1 control computer
o no epics monitoring
o firmware ADF, TAB
- generate pseudo random bit patterns ADF
- receive and verify patterns at full speed
interfacing
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o ADF-TAB cabling
o VME/SCL-TAB cabling
o SCLD - ADF cabling
software
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o control software (configure fpga's, ADF & TAB)
people
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Jovan
Hal
Dan
Philippe
Jorge
Alan
Lyn
tests
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o full speed tests for bit error/rate tests with:
o one channel
o multiple cards/channels
o multiple TABs